The Fastmicro Sample Scanner measures particle contamination on surfaces indirectly. Particles are lifted from the part with a tape-lift sampler, and the scanner counts, sizes and locates them in seconds, down to 0.5 µm.
The samplers, Fastmicro Samplers and Particle Measurement Cards (PMCs), take samples from flat, curved and recessed surfaces, including rough or hard-to-reach areas, and leave no measurable residue. A card holder is used for these indirect measurements, and a 2-inch wafer holder lets the same scanner read witness wafers for particle fallout.
| Measurement | Indirect, with tape-lift samplers or PMCs |
|---|---|
| Lower detection limit | 0.5 µm (PSL equivalent) |
| Standard | ISO 14644-9, surface cleanliness by particle concentration |
| Pick-up efficiency | Above 90% |
| Repeatability | Above 90% |
| Scan area | 225 mm² |
| Sampler | 20 mm diameter tape-lift sampler |
| Results | Particle count, size and position, in seconds |
| Holders | Card sampler holder; 2-inch wafer holder for fallout measurements |
For ASML Grade 1 product qualification, Fastmicro's Particle Measurement Cards are the released sampling solution for the Sample Scanner.
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